Major Characterization Facilities

• Scanning probe microscope facility
• Optical tweezer facility
• Quartz crystal microbalance
• Self-nulling ellipsometers
• Surface plasmon resonance imaging system
• Optical microscopes
• Dynamic light scattering spectrometer
• Attenuated total reflection FTIR spectrometer
• Cryo-transmission electron microscope
• Scanning confocal laser microscope
• Polarization modulation infrared reflection absorption spectrometer
• Raman microprobe spectrometer
• Infrared microscope
• Optical profiler
  
• Differential pressure experiment

Sample Preparation Facilities

• Spincoater
• Laminar flow cabinet
• Ultrapure water facility
• Vacuum ovens
• UV/ozone cleaner
• Plasma cleaner
• CO₂ snow cleaner
• High temperature oven
• Langmuir trough
• Microbiology facilities

Self-Nulling Ellipsometers

Custom-Built Ellipsometer

Custom-built self-nulling ellipsometer equipped with custom-built hot stage (reflection mode) and optical furnace (transmission mode). Controlled by PC using custom-developed Labview program.

Self-nulling ellipsometer: Reflection Mode

Self-nulling ellipsometer: Transmission mode

Optrel Multiskop

The Optrel Multiskop is a multi-purpose instrument that can be used to perform the following experiments: ellipsometry, surface plasmon spectroscopy, waveguide spectroscopy and Brewster angle microscopy, plus all of the corresponding imaging techniques.

Optrel Multiskop