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The X-ray Diffraction and Scattering Group of the University of Guelph develops novel x-ray techniques for the structural characterization of bulk and nanomaterials. For this purpose we use in-house and synchrotron radiation in a number of different diffraction and scattering techniques, i.e.: powder, single crystal and multiple beam diffraction, SAXS, reflectivity measurements and PDF analysis.

The group presently has two laboratories. One of them is located in room MacN 013 and hosts a Mo radiation low resolution PDF diffractometer, a high resolution powder diffractometer, a NanoSTAR SAXS camera and a HUBER four circle diffratometer for high resolution applications. The secon lab is located in the New Science Complex, NSC 1201, and hosts a Protein Station and a HUBER four circle diffratometer for high flux applications.