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Analysis of Nanomaterials (NANO*2100)

Course code: 
NANO*2100
Section: 
01
Course term: 
Winter 2011
Course instructor: 
De-Tong Jiang
Details: 

Course Information

Prerequisites 

NANO*2000

Calendar Description

This course provides an in-depth study of the important instruments that have been developed to analyze nanostructured materials. Useful information that is derived from scattering processes involving X-rays, visible light, electrons, and neutrons will be studied. Microscopic techniques such as Atomic Force Microscopy will also be studied because of the nanoscale structural information that they can provide. The study of spectroscopic techniques also forms part of the course. The application of these instruments to lithographic production techniques is also developed.

Lecturer

D. T. Jiang
MacN 223 ext.: 53982
e-mail: djiang@uoguelph.ca

Office Hours

MacN 223
Tuesday and Thursday
1:30 to 2:30 PM

Lectures

Monday, Wednesday, and Friday 9:30-10:20AM MacN 201

Resources

  • Introduction to Nanoscience by Hornyak, Dutta, Tibbals, and Rao, 2008
  • Nanophysics and Nanotechnology, E.L. Wolf, 2006

Evaluation

Deliverables Weight
Assignments
Due at the start of designated classes (Late penalty 10% per day)
20%
Laboratory 30%
Mid-Term Exam 20%
Final Exam 30%

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Contact Us

Department of Physics
University of Guelph
50 Stone Road E.
Guelph, Ontario, Canada
N1G 2W1

1-519-824-4120 x 52261
physinfo@uoguelph.ca


Source URL: https://www.physics.uoguelph.ca/course-outlines/analysis-nanomaterials-nano2100-0