Analysis of Nanomaterials (NANO*02100)

Course Information

Prerequisite

NANO*2000

Calendar Description

This course provides an in-depth study of the important instruments that have been developed to analyze nanostructured materials. Useful information that is derived from scattering processes involving X-rays, visible light, electrons, and neutrons will be studied. Microscopic techniques such as Atomic Force Microscopy will also be studied because of the nanoscale structural information that they can provide. The study of spectroscopic techniques also forms part of the course. The application of these instruments to lithographic production techniques is also developed.

Lecturer

Xiaorong Qin
MacN 449 (Ext. 53675)
xqin@physics.uoguelph.ca

Lectures

Mon., Wed., Fri. 9:30 – 10:20 am.
Room – MacN 201

Course Materials

• Modern Physics for Scientists and Engineers, 2nd Edition, by Taylor, Zifiratos and Dubson, 2004
• Solid State Physics, by Ashcroft and Mermin, 1976
• Absorption and Scattering of Light by Small Particles, by Bohren and Huffman, 1983

Evaluation

You are required to attend lectures.

Course Policies

Medical Certificate

Not generally required. However, if you miss a TEST or EXAM, then you should see your College Counselor and get a note from him/her.

Collaboration versus Copying

You are encouraged to discuss with others as you learn the material and work on the assignments. However, the work you submit must be your own (your understanding written in your own way) and not a copy of someone else's work.