De-Tong Jiang

Dr. De-Tong Jiang
Associate Professor
Email: 
djiang@uoguelph.ca
Phone number: 
519-824-4120 x53982
Office: 
MacN 223
Summary: 

I obtained my B.Sc. in Theoretical Physics in 1982 from Jilin University, P.R. China. In 1984 on a scholarship from the Education Ministry of PRC I joined the M.Sc. graduate study program in the Physics Department of Simon Fraser University, then in 1986 I transferred into the Ph.D. program in the same department and in 1991 I obtained my doctoral degree in Condensed Matter Physics. From 1991-1994 I had my postdoctoral training in the Chemistry Department at the University of Western Ontario, during the time period 1992-1994 I was supported by a NSERC postdoctoral fellowship.

From 1982-1984 I worked as an Assistant Lecturer in the Physics Department, Jilin University. From 1994-1999 I was involved in the construction of the Sector 20 synchrotron radiation beamline facility at the Advanced Photon Source (APS), Argonne National Laboratory, initially as an research associated working offsite at Simon Fraser University (1994-1996) and then as the beamline scientist for 20ID/APS (1996-1999). From 2000-2005 I worked as a staff scientist at the then newly established Canadian Light Source (CLS), and since year 2001 I have been appointed as an Adjunct Professor in the department of Physics and Engineering Physics, University of Saskatchewan. In 2005 I joined the Department of Physics at the University of Guelph, as an Assistant Professor.

Since the beginning of the CLS Hard X-ray Micro-Analysis beamline project in 2000, I have been serving as the Beam Team Leader coordinating its design, construction and user operation. During 2000-2003 I served as a member of the CLS Users’ Advisory Committee; and have been a member on the CLS Beamline Advisory Committee since 2000. I have been serving as referee for a number of international journals and for NSERC; as external examiner for PhD theses for McGill and Waterloo. In the ongoing CLS Brockhouse Sector development project I am a Co-PI and function as a consultant for technical issues. I am also an co-applicant for the PNCSRF operation supported by an NSERC MFA which operates the Canadian portion of the Sector 20 at the APS, Argonne National Laboratory. 

XAFS is a multidisciplinary technique that when used skillfully becomes a powerful tool for the charaterization of local atomic structure. X-ray absorption spectroscopy makes use of monochromatic x-ray's to excite core level electrons within a material, and uses the resulting photo-electron wave as an efficient probe of an atom's local chemical/atomic neighbourhood. It provides us with element specific information about the oxidation state of the absorbing atom, the site coordination and bond characteristics. To learn more about the technique, check out this tutorial at xafs.org

My current research involves four aspects:

  1. growth and structural property studies of organic semiconductor films;
  2. structural properties of nickel silicide thin films;
  3. arsenic speciation in environmentally important systems;
  4. structural properties of materials under extreme conditions. The common theme is applying a multitude of synchrotron radiation based techniques to probe the atomic/molecular structures for understanding the structure-function relationships and in some cases for acquiring the atomic/molecular level control of complex structures.

In the first area, our effort has been focused on the polyacene semiconductor thin films. Three projects are underway: A. in situ and exsitu carbon 1s polarization dependent NEXAFS studies on the tetracene and pentacene growth mechanisms on various solid substrates; B. gas phase NEXAFS of the polyaromatic molecules and theoretical simulation (StoBe code); C. exsitu grazing-incidence X-ray diffraction (GIXD) study on the thickness dependence of the expitaxial structures of tetracene on reduced silicon surfaces. The polyacene thin film NEXAFS and GIXD projects are in collaboration with Qin (U of G) group. Systems studied include tetracene and pentacene on H/Si(001) (wet chemistry method) and SiO2 substrates; and tetracene on flat and specific terraced H/Si(001) substrates. The polyacene gas phase project aims at developing a thorough understanding of the C 1s near edge X-ray absorption spectroscopy of these molecules for application as a structural tool in studying the polyacene semiconductor films. In the second area, we’ve been collaborating with Lavoie’s group (IBM, Yorktown Heights) to investigate the XANES and XAFS signatures of the industrial nickel silicide layers targeted for new generations of nanoscale electronic applications. Recently we have demonstrated that the method we’re developing is capable to identify the epitaxial phase of an interface region with thickness of 1-3 nm, where conventional diffraction methods have not been effective. The third research area, the Arsenic speciation using XAFS endstation at CLS HXMA beamline has been carried out in collaboration with N. Chen (CLS), G. Demopoulos (McGill), and J. Rowson (AREVA Res., Canada), and S. Glasauer (Dept. of Land Resource Sci., U of Guelph). In these studies we have systematically studied the pH, temperature, and aging time factors in the formation of scorodite phase under the geochemical conditions mimicking that at uranium mine tailing process facilities. For the fourth area, the study of materials under extreme conditions involves diffraction and XAFS studies under high pressure environment generated with diamond anvil cells (DAC) (J. Tse/U of S, S. Desgreniers/U Ottawa, D. Klug/NRC, N. Chen and C.Y. Kim/CLS), aimed at the fundamental structural and electronic properties of materials under high pressure. A new research project is in progress which will invoke x-ray absorption spectroscopy studies on material electronic structures under high pressure. 

Our Lab

Located in the basement of the MacNaughton building on the University of Guelph main campus, our facilities provide a quiet office & lab environment condusive to the production XAFS sample preparation, as well as providing workspace for academic enrichment. Due to the nature of our experiments, it is necessary to travel to synchrotron facilities for data acquisition. Consequently, our group is always on the move with frequent visits to the Advanced Photo Source in Chicago, IL and the Canadian Light Source in Saskatoon, SK.

 

  1. Ethylenediamine-Enabled Sustainable Sythesis of Mesoporous Nanostructured Li2Fe(II)SiO4 Particles from Fe(III) Aqueous Solution for Li-Ion Battery Application Wei, H.; Lu, X.; Chiu, H-C.; Wei, B.; Gauvin, R.; Arthur, Z.; Emond, V.; Jiang, D-T.; Zaghib, K.; Demopoulos, G.P., ACS SUSTAINABLE CHEMISTRY & ENGINEERING, 2018

  2. In Operando XANES & XRD Investigation into the Rate-Dependent Transport Properties of Lithium Iron Silicate Cathodes, Arthur, Z.; Chiu, H-C.; Lu, X.; Chen, N.; Emond, V.; Demopoulos, G.P.; Jiang, D-T., MRS ADVANCES, 2017

  3. Density functional theory insights into the structural stability and Li diffusion properties of monoclinic and othorhombic Li2FeSiO4 cathodes Lu, X.; Chiu, H-C.; Bevan, K. H.; Jiang, D-T.; Zaghib, K.; Demopoulos, G.P., JOURNAL OF POWER SOURCES, 2016

  4. Li-ion storage dynamics in metstable nanostructured Li2FeSiO4 cathode: Antisite-induced phase transition and lattice oxygen participation Lu, X.; Chiu, H-C.; Arthur, Z.; Zhou, J.; Wang, J.; Chen, N.; Jiang, D-T.; Zaghib, K.; Demopoulos, G.P., JOURNAL OF POWER SOURCES, 2016

  5. Spontaneous reaction between an uncharged lithium iron silicate cathode and a LiPF6-based electrolyte, Arthur, Z.; Chiu, H.-C.; Lu, X.; Chen, N.; Emond, V.; Zaghib, K.; Jiang, D.-T.; Demopoulos, G. P., CHEMICAL COMMUNICATIONS, 2015

  6. Thickness-dependent mobility in tetracene thin-film field-effect-transistors, Shi, J.; Jiang, D.-T.; Dutcher, J. R.; Qin, X.-R., JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2015

  7. In situ XANES & XRD Study of interphasial reaction between uncharged Li2FeSiO4 cathode and LiPF6-based electrolyte, Arthur, Z.; Chiu, H.-C.; Lu, X.; Chen, N.; Emond, V.; Demopoulos, G.; Jiang, D.-T., 16TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS16), 2015 (In Press)

  8. Spectroscopic Evidence of Uranium Immobilization in Acidic Wetlands by Natural Organic Matter and Plant Roots, Li, Dien; Kaplan, Daniel I.; Chang, Hyun-Shik; Seaman, John C.; Jaffe, Peter R.; van Groos, Paul Koster; Scheckel, Kirk G.; Segre, Carlo U.; Chen, Ning; Jiang, De-Tong; Newville, Matthew; Lanzirotti, Antonio, ENVIRONMENTAL SCIENCE & TECHNOLOGY, 2015

  9. Retention and chemical speciation of uranium in an oxidized wetland sediment from the Savannah River Site, Li, Dien; Seaman, John C.; Chang, Hyun-Shik; Jaffe, Peter R.; van Groos, Paul Koster; Jiang, De-Tong; Chen, Ning; Lin, Jinru; Arthur, Zachary; Pan, Yuanming; Scheckel, Kirk G.; Newville, Matthew; Lanzirotti, Antonio; Kaplan, Daniel I., JOURNAL OF ENVIRONMENTAL RADIOACTIVITY, 2014

  10. XAFS Study of Arsenical Nickel Hydroxidei, Chen, N.; Kim, E.; Arthur, Z.; Daenzer, R.; Warner, J.; Demopoulos, G. P.; Joly, Y.; Jiang, D. T., 15TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS15), 2013

  11. Multiple Scattering Debye-Waller Factors for Arsenate, Kim, E.; Chen, N.; Arthur, Z.; Warner, J.; Demopoulos, G. P.; Rowson, J. W.; Jiang, D. T., 15TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS15), 2013

  12. Reciprocal-space mapping of lateral single-crystal domains with grazing-incidence x-ray diffraction for tetracene on H/Si(001), Tersigni, A.; Qin, X. R.; Kim, C-Y; Gordon, R. A.; Jiang, D. T., PHYSICAL REVIEW B, 2011

  13. High energy synchrotron X-ray diffraction study of lead oxide silicate glasses at the Canadian light sourcei, Tse, J. S.; Wang, X. D.; Jiang, D. T.; Chen, N.; Jiang, J. Z., NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2011

  14. Structural characterization of poorly-crystalline scorodite, iron(III)-arsenate co-precipitates and uranium mill neutralized raffinate solids using X-ray absorption fine structure spectroscopy, Chen, N.; Jiang, D. T.; Cutler, J.; Kotzer, T.; Jia, Y. F.; Demopoulos, G. P.; Rowson, J. W., GEOCHIMICA ET COSMOCHIMICA ACTA, 2009

  15. EXAFS characterization of poorly crystalline ferric arsenate undergoing transformation to scorodite, Chen, N.; Le Berre, J. F.; Warner, J. A.; Cutler, J. N.; Jiang, D. T.; Rowson, J. W.; Demopoulos, G. P., GEOCHIMICA ET COSMOCHIMICA ACTA, 2008

  16. Structural phase transition in CaH2 at high pressures, Tse, J. S.; Klug, D. D.; Desgreniers, S.; Smith, J. S.; Flacau, R.; Liu, Z.; Hu, J.; Chen, N.; Jiang, D. T., PHYSICAL REVIEW B, 2007

  17. Wiggler-base hard x-ray spectroscopy beamline at CLS, Jiang, D. T.; Chen, N.; Sheng, W., SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2, 2007

  18. Front end x-ray beam position monitors at the CLS, Smith, S.; Shu, D.; Bergstrom, J.; Jiang, D. T., SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2, 2007

  19. Canadian Light Source front ends development, Jiang, D. T.; Shu, D.; Sheng, W., SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2, 2007

  20. XAFS of synthetic Iron(III)-Arsenate co-precipitates and uranium mill neutralized raffinate, Chen, N.; Jiang, D. T.; Cutler, J.; Demopoulos, G. P.; Rowson, J. W., 13TH INTERNATION CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS13), 2007

  21. Characteristics of the MBE1 end-station at PNC/XOR, Gordon, R. A.; Crozier, E. D.; Jiang, D.-T.; Shoults, J.; Barg, B.; Budnik, P. S., 13TH INTERNATION CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS13), 2007

  22. XAFS at the Canadian light source, Jiang, D. T.; Chen, N.; Zhang, L.; Malgorzata, K.; Wright, G.; Igarashi, R.; Beauregard, D.; Kirkham, M.; McKibben, M., 13TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS13), 2007

  23. Structure of tetracene films on hydrogen-passivated Si(001) studied via STM, AFM, and NEXAFS, Tersigni, A.; Shi, J.; Jiang, D. T.; Qin, X. R., PHYSICAL REVIEW B, 2006

  24. Compton scattering of elemental silicon at high pressure, Tse, JS; Klug, DD; Jiang, DT; Sternemann, C; Volmer, M; Huotari, S; Hiraoka, N; Honkimaki, V; Hamalainen, K, APPLIED PHYSICS LETTERS, 2005

  25. In situ XAFS study of Fe epitaxially grown by MBE on GaAs(001)-4x6, Gordon, RA; Crozier, ED; Jiang, DT; Budnik, PS; Monchesky, TL; Heinrich, B, SURFACE SCIENCE, 2005

  26. Evolution of an iron film on GaAs(001)-4x6, Gordon, R. A.; Budnik, P. S.; Jiang, D. T.; Crozier, E. D., PHYSICA SCRIPTA, 2005

  27. The nature of arsenic in uranium mill tailings by X-ray absorption spectroscopy, Cutler, JN; Chen, N; Jiang, DT; Demopoulos, GP; Jia, Y; Rowson, JW, JOURNAL DE PHYSIQUE IV, 2003

  28. Mineralogical characterization of arsenic in uranium mine tailings precipitated from iron-rich hydrometallurgical solutions, Moldovan, BJ; Jiang, DT; Hendry, MJ, ENVIRONMENTAL SCIENCE & TECHNOLOGY, 2003

Name Role
Cameron McGuire MSc Candidate

Alumni

  • Zach Arthur, PhD
  • Andrew Sacchetti, MSc
  • Vincent Emond, MSc
    Vincent finished his Master's degree in May 2018, with a focus on the technical aspects of acquiring high resolution X-ray diffraction data at Synchrotron facilities. Ths project is an extension of the Lithium Metal Silicates research being performed in collaboration with the McGill, HyrdoMET research group
  • Edward Kim
    Eddie is currently a PhD student in the Olivetti Group at the Dept. Of Materials Science and Engineering at MIT. He works on applied machine learning and natural language processing algorithms, with a focus on data mining from scientific literature. His current project focuses on constructing an automated computational pipeline that intelligently extracts data from materials science journal articles in order to construct a comprehensive database of materials synthesis techniques and protocols.
  • Stephen Glazier, PhD
    Stephen’s USRA work with the Jiang group during his undergraduate physics degree investigated the cation distribution in manganese spinels. This research experience led to him working with the Jeff Dahn research group at Dalhousie University in Halifax, Nova Scotia. He completed his MSc developing novel electrode materials for lithium ion batteries, and investigated high voltage battery and electrolyte performance for his PhD. He was awarded an NSERC CGS-M during his masters and an NSERC PGS-D for his PhD studies.