Analysis of Nanomaterials (NANO*2100)
Code and section: NANO*2100*01
Term: Winter 2011
Instructor: De-Tong Jiang
Details
Course Information
Prerequisites
NANO*2000
Calendar Description
This course provides an in-depth study of the important instruments that have been developed to analyze nanostructured materials. Useful information that is derived from scattering processes involving X-rays, visible light, electrons, and neutrons will be studied. Microscopic techniques such as Atomic Force Microscopy will also be studied because of the nanoscale structural information that they can provide. The study of spectroscopic techniques also forms part of the course. The application of these instruments to lithographic production techniques is also developed.
Lecturer
D. T. Jiang
MacN 223 ext.: 53982
e-mail: djiang@uoguelph.ca
Office Hours
MacN 223
Tuesday and Thursday
1:30 to 2:30 PM
Lectures
Monday, Wednesday, and Friday 9:30-10:20AM MacN 201
Resources
- Introduction to Nanoscience by Hornyak, Dutta, Tibbals, and Rao, 2008
- Nanophysics and Nanotechnology, E.L. Wolf, 2006
Evaluation
Deliverables | Weight |
---|---|
Assignments Due at the start of designated classes (Late penalty 10% per day) |
20% |
Laboratory | 30% |
Mid-Term Exam | 20% |
Final Exam | 30% |