Xiaorong Qin

Xiaorong Qin

Associate Professor

Contact Information

Telephone: 519-824-4120 x53675

Email: xqin@uoguelph.ca

Office: MacN 449

Online: Research Page


I obtained my B.Sc. (1983) and M.Sc. (1986) in Electronics and Laser Physics from Tsinghua University (Beijing), China. After that I came to Canada at Simon Fraser University, B.C. to work on my Ph.D, which I obtained in 1992 in Condensed Matter Physics.

Professional Experience

In 1993-1995, I did my NSERC postdoctoral training in the Department of Chemistry, University of Western Ontario, ON, Canada;

In 1995-2000, I worked as Research Associate in the Department of Materials Science and Engineering, University of Wisconsin-Madison, USA; 

In 2000, I joined the Department of Physics at University of Guelph, ON, Canada, as an assistant professor; and in 2007, I became an associate professor.  

Professional Activities & Awards

I am a reviewer for numerous international journals and NSERC grant applications. I have been coordinating the CAP lectures and exams at Guelph since 2003. I am a member of APS (American Physical Society), MRS (Material Research Society), AVS (American Vacuum Society) and CAP (Canadian Association of Physicists). I am a recipient of NSERC University Faculty Award in 2000-2005.

Research Activities

Driven by the present trend of device miniaturization and emerging opportunities of molecular electronics, high-precision measurement and atomic-scale manipulation of materials are increasingly required. Because when the device dimensions decrease to the point where a single molecular layer may represent a significant percentage of the device scales, surface and interface effects (surface stress and relaxation, morphological and structural irregularities, concentration of unsaturated bonds, and atomic-intermixing, etc.) can significantly influence device properties, understanding surface reactions and the ordering of atoms or molecules are thus highly desirable. The research of my group is centered on using scanning tunnelling microscopy/spectroscopy (STM/STS), atomic force microscopy (AFM), and scanning near-field optical microscopy (SNOM) to characterize structural, electronic and optical properties of surfaces and interfaces at atomic / molecular / nanometer scale. We also use other experimental techniques including ultrahigh vacuum, surface science, and synchrotron radiation. The research activities mainly cover two areas:

  1. To study the structural properties of vacuum vapour-deposited thin films of organic small molecules (polyaromatic hydrocarbons), such as tetracene, on silicon-based substrates or passivated silicon surfaces. The aim is to achieve a molecular-level understanding of the interface formation mechanisms (at a few molecular layers in thickness) and to characterize the role of film crystallinity, defects and substrate properties in controlling the relevant film quality and stability in the hybrid organic-inorganic junctions;
  2. To investigate carrier transport and other exceptional properties of the films for seeking their potential applications in organic electronics.